Volume 4, Issue 4 (12-2016)                   IJRSM 2016, 4(4): 15-20 | Back to browse issues page

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Masoumbeigi M, Aliasgharzadeh A, Nazififard M, Ramezani-moghadam A. Feasibility study of using PIN semiconductors for diagnostic X-ray radiation dosimetry. IJRSM 2016; 4 (4) :15-20
URL: http://rsm.kashanu.ac.ir/article-1-215-en.html
Abstract:   (6365 Views)

Knowing patient exact dose during radiological activities is considered as one of the main principles to decrease radiation-induced dangers which are not really necessary and affect a great deal of people. In this respect, in recent years many extensive studies have been done on types of photodiodes and production of X-ray detectors using semiconductor elements. Since these elements are not very expensive and are too small in size and we can gain information of received dose immediately and without wasting time, they are mostly used. We aim to design a dosimeter using semiconductor elements for X-ray diagnostic radiation dosimetry. We used a typical silicon diode. Also, a stable circuit was applied to detect diagnostic X-ray radiations. To determine logical correlation between the electronic behavior of PIN sensor and specific parameters of X-ray (KV, mA.S), the designed circuit and calibrated ionization dosimeter were simultaneously irradiated by the diagnostic X-ray radiation with different energies and intensities. Finally, signal behavior was converted to digital amounts by the designed circuit. The amounts were then compared with received dose as recorded by ionization dosimetry. Results of the designed dosimetry behavior and ionization dosimetry simultaneously showed that the designed dosimetry responses are rather linear in different radiations whereas responses of the dosimetry under study is linear in low voltages while in high voltages no specific linear relation was found. It seems that used photodiode due to its availability, and low cost can be used as a dosimeter to measure diagnostic x-ray radiations in low energies.

Type of Study: Applicable | Subject: Special

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