Characterization of BCN compound using deuteron induced gamma-ray emission method

Document Type : Original Article

Authors

Physics and accelerators research School, Nuclear Science and Technology Research Institute, AEOI, Tehran, Iran

Abstract

This paper introduces the deuteron-induced gamma-ray emission technique (DIGE) for the quantification of BCN samples. BCN is a metal-free semiconductor that has a graphene-like structure and its properties are strongly dependent on the composition of the constituent elements, i.e. boron, carbon, and nitrogen. So, the quantitative analysis of BCN is essential. DIGE is an ion beam analysis method that simultaneously measures light elements such as boron, carbon, nitrogen, oxygen and etc. Therefore, it is a proper method for characterizing BCN samples. A Boron-doped graphene carbon nitride (g-C3N4) was synthesized via heating thiourea and subsequently adding boric acid. The synthesized g-C3N4 and BCN were studied using X-ray diffraction (XRD) and Fourier transform infrared spectroscopy (FTIR) to determine that the correct form of the samples was grown..Then, the elemental concentrations in the samples were determined by measuring the prompt gamma-ray from 11B(d,pγ1-0)12B, 14N(d,pγ4-1)13N and 12C(d,pγ1-0)13C reactions.

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References

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